Optical emission spectrometry (OES) and X-Ray fluorescence are most commonly used techniques for the analysis of metals and solid samples.
Sample preparation of metals and materials have become more and more important because of the rapid development and improvement of both software as well as OES and XRF-devices during the past few years that shifts the detection limit for trace analyses. It is crucial to have the sample properly prepared.
The sample needs to be both representative, homogeneous and with an even surface in order to eliminate factors that can influence the results.
For the preparation of solid metal samples Metkon offers manual and automatic sample preparation machines - from the small table-top disc surface grinder to automatic milling machine. With Metkon Sample Preparation Machines, you feel yourself ready for the analysis.
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